THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY,New Delhi,IN | INDIAN INSTUTE OF TECHNOLOGY GUWAHATI,Assam, Guwahati,IN | The Secretary Department of Electronics and Information Technology (DEITY),New Delhi,IN | Indian Institute of Technology Guwahati,Guwahati,IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH DEITY | INDIAN INSTITUTE OF TECH GUWAHATI | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH | INDIAN INSTUTE OF TECH GUWAHATI
Patent No. US10673525B2
Engineering and Technology
Published
Filed 2018-01-16
Published 2020-06-02
SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,Guwahati, Assam,IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY),New Delhi,IN | INDIAN INSTITUTE OF TECH GUWAHATI | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH DEITY
Patent No. US20200024727A1
Engineering and Technology
Published
Filed 2018-06-12
Published 2020-01-23
FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY,New Delhi,IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,Assam Guwahati,IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH | INDIAN INSTITUTE OF TECH GUWAHATI
Patent No. US20190013865A1
Engineering and Technology
Published
Filed 2018-01-16
Published 2019-01-10
SYSTEM, VORRICHTUNG UND VERFAHREN ZUR ÜBERWACHUNG EINES OBERFLÄCHENPROFILS UND DICKENMESSUNG IN DÜNNSCHICHTEN | SYSTÈME, APPAREIL ET PROCÉDÉ DE SURVEILLANCE DE PROFIL DE SURFACE ET DE MESURE D'ÉPAISSEUR DANS DES COUCHES MINCES | SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECH DEITY | INDIAN INSTITUTE OF TECH GUWAHATI
Patent No. EP3387482A4
Engineering and Technology
Published
Filed 2016-07-18
Published 2019-12-25
SYSTEM, VORRICHTUNG UND VERFAHREN ZUR ÜBERWACHUNG EINES OBERFLÄCHENPROFILS UND DICKENMESSUNG IN DÜNNSCHICHTEN | SYSTÈME, APPAREIL ET PROCÉDÉ DE SURVEILLANCE DE PROFIL DE SURFACE ET DE MESURE D'ÉPAISSEUR DANS DES COUCHES MINCES | SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
Secretary Department of Electronics and Information Technology (Deity),New Delhi 110003,IN,101637428 | Indian Institute of Technology Guwahati,Guwahati, Assam 781039,IN,101637247
Patent No. EP3387482A1
Engineering and Technology
Published
Filed 2016-07-18
Published 2018-10-17
OPTISCHES FREIRAUMKOMMUNIKATIONSSYSTEM, VORRICHTUNG UND VERFAHREN DAFÜR | SYSTÈME DE COMMUNICATION OPTIQUE EN ESPACE LIBRE, APPAREIL, ET PROCÉDÉ ASSOCIÉ | FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
Secretary Department of Electronics and Information Technology (Deity),New Delhi 110003,IN,101637428 | Indian Institute of Technology Guwahati,Guwahati, Assam 781039,IN,101637247
Patent No. EP3323127A2
Engineering and Technology
Published
Filed 2016-07-15
Published 2018-05-23
SYSTÈME, APPAREIL ET PROCÉDÉ DE SURVEILLANCE DE PROFIL DE SURFACE ET DE MESURE D'ÉPAISSEUR DANS DES COUCHES MINCES | SYSTEM, APPARATUS AND METHOD FOR MONITORING OF SURFACE PROFILE AND THICKNESS MEASUREMENT IN THIN FILMS
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY),IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,IN
Patent No. WO2017098343A1
Engineering and Technology
Published
Filed 2016-07-18
Published 2017-06-15
SYSTÈME DE COMMUNICATION OPTIQUE EN ESPACE LIBRE, APPAREIL, ET PROCÉDÉ ASSOCIÉ | FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
BORUAH Bosanta Ranjan,IN | KONWAR Santanu,IN
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY),IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,IN
Patent No. WO2017009808A3
Engineering and Technology
Published
Filed 2016-07-15
Published 2017-03-09
SYSTÈME DE COMMUNICATION OPTIQUE EN ESPACE LIBRE, APPAREIL, ET PROCÉDÉ ASSOCIÉ | FREE SPACE OPTICAL COMMUNICATION SYSTEM, APPARATUS AND A METHOD THEREOF
BORUAH Bosanta Ranjan,IN | KONWAR Santanu,IN
THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY),IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,IN
Patent No. WO2017009808A2
Engineering and Technology
Published
Filed 2016-07-15
Published 2017-01-19
자유 공간 광 통신 시스템, 장치 및 방법 | OMITTED
BORUAH BOSANTA RANJAN | KONWAR SANTANU
더 세크리터리 디파트먼트 오브 일렉트로닉스 앤드 인포메이션 테크놀로지 (데이티),IN | 인디안 인스티튜트 오브 테크놀로지 구와하티,IN | THE SECRETARY DEPARTMENT OF ELECTRONICS AND INFORMATION TECHNOLOGY (DEITY),IN | INDIAN INSTITUTE OF TECHNOLOGY GUWAHATI,IN
Patent No. KR2018032606A
Engineering and Technology
Published
Filed 2016-07-15
Published 2018-03-30
用于薄膜中的表面轮廓和厚度测量的监测的系统、装置和方法 | system, device and method for monitoring surface profile and thickness measurement in the film
印度电子与信息技术部(DEITY) | 印度理工学院古瓦哈提分校 | The Secretary Department Of Electronics And Information Technology (deity),IN | Indian Institute Of Technology Guwahati
Patent No. CN108700738A
Engineering and Technology
Published
Filed 2016-07-18
Published 2018-10-23
A SYSTEM AND METHOD FOR LASER BEAM SCANNING WITH PERIODIC SWITCHING OF POLARIZATION OF THE BEAM